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Bragg and Fresnel Diffraction Imaging Using Highly Coherent X-Rays

Published online by Cambridge University Press:  02 July 2020

P. Cloetens ,
J. Baruchel ,
J.P. Guigay ,
W. Ludwig ,
L. Mancini ,
P. Pemot  and
M. Schlenker
P. Cloetens
Affiliation:
European Synchrotron Radiation Facility, BP 220, F-38043, Grenoble, France EMAT, University of Antwerp (RUCA), B-2020, Antwerp, Belgium
J. Baruchel
Affiliation:
European Synchrotron Radiation Facility, BP 220, F-38043, Grenoble, France
J.P. Guigay
Affiliation:
European Synchrotron Radiation Facility, BP 220, F-38043, Grenoble, France
W. Ludwig
Affiliation:
European Synchrotron Radiation Facility, BP 220, F-38043, Grenoble, France
L. Mancini
Affiliation:
European Synchrotron Radiation Facility, BP 220, F-38043, Grenoble, France
P. Pemot
Affiliation:
European Synchrotron Radiation Facility, BP 220, F-38043, Grenoble, France
M. Schlenker
Affiliation:
Lab. Louis Néel, CNRS, BP 166, F-38042, Grenoble, France
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Extract

X-ray imaging started over a century ago. For several decades its only form was absorption radiography, in which contrast is due to local variations in beam attenuation. About forty years ago, a new form of X-ray imagery, Bragg-diffraction imaging or X-ray topography, developed into practical use. It directly reveals crystal defects in the bulk of large single crystals, and paved the way to microelectronics by leading to the growth of large, practically perfect, crystals. The advent of third-generation synchrotron radiation sources of X-rays such as ESRF and APS is now making possible, through the coherence of the X-ray beams, a novel form of radiography, in which contrast arises from phase variations across the transmitted beam, associated with optical path length differences, through Fresnel diffraction. Phase radiography and its three-dimensional companion, X-ray phase tomography, are providing new information on the mechanics of composites as well as on biological materials.

Type
Novel X-Ray Methods: From Microscopy to Ultimate Detectability
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 376 - 377
Copyright
Copyright © Microscopy Society of America

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References

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