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Boron K-Edge Electron Energy Loss Fine Structure Study of Gadolinium-Containing Sodium-Alumino-Borosilicate Glasses

Published online by Cambridge University Press:  02 July 2020

M. Qian ,
L. Li ,
H. Li  and
D. M. Strachan
M. Qian
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington
L. Li
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington
H. Li
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington
D. M. Strachan
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington
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Extract

Up to 47 mass% of gadolinium can be dissolved in a baseline borosilicate glass (mol%) 20 B2O3, 5 A12O3, 60 SiO2, and 20 Na2O. Understanding the dissolution of Gd in borosilicate melts is important in the optimization of glass formulations. However, probing amorphous materials with spectroscopic techniques is challenging research when little knowledge of the local chemical environment of the glass network is available. Electron energy loss fine structure (ELFS) spectroscopy is one available technique that has several advantages for probing the local structure of amorphous materials. This technique gives local atomic structure information equally well for both amorphous and crystalline materials. There is high sensitivity for low Z elements like boron, oxygen, aluminum, and silicon whereas x-ray absorption fine structure (XAFS) technique faces experimental difficulties. Hence, results from ELFS can be complimentary to the results from XAFS. For medium to high Z elements, one can use the L- or M-edges of the elemental spectrum.

Type
Electron Energy-Loss Spectroscopy (EELS) and Imaging
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 196 - 197
Copyright
Copyright © Microscopy Society of America

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References

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