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Better Contrast for Imaging Defects by ABF

Published online by Cambridge University Press:  04 August 2017

Peng Gao
Affiliation:
Electron microscopy laboratory, School of Physics, and Center for Nanochemistry, Peking University, Beijing 100871, China Collaborative Innovation Center of Quantum Matter, Beijing 100871, China Center for Nanochemistry, Peking University, Beijing 100871, China
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656, Japan
Bin Feng
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656, Japan
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656, Japan
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656, Japan Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya 456-8587, Japan WPI Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Okunishi, E., et al, Microsc.Microanal. 15(Suppl 2 2009 164.Google Scholar
[2] Findlay, S., et al, App.Phys.Lett. 95 2009 191913.Google Scholar
[3] Gao, P., et al, Nature Communications 7 2016 11318.Google Scholar
[4] The authors gratefully acknowledge the financial support through a Grant-in-Aid for Scientific Research on Innovative Areas “Nano Informatics” (Grant No. 25106003) from Japan Society for the Promotion of Science (JSPS), and “Nanotechnology Platform” (Project No. 12024046) from the Ministry of Education, Culture, Sports, Science and Technology in Japan (MEXT), the National Natural Science Foundation of China (51672007, 51502007), National Basic Research Program of China (2016YFA0300804, 2016YFA0300903), and “2011 Program” Peking-Tsinghua-IOP Collaborative Innovation Centre for Quantum Matter..Google Scholar