Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2024-12-26T09:32:41.630Z Has data issue: false hasContentIssue false
  • English
  • Français

Benchmarking the Performance of a New Photoelectron Source

Published online by Cambridge University Press:  22 July 2022

Frances Quigley ,
Clive Downing ,
Cormac McGuinness  and
Lewys Jones
Frances Quigley*
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin, Ireland
Clive Downing
Affiliation:
Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin, Ireland
Cormac McGuinness
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland
Lewys Jones
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin, Ireland
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Microscopy Infrastructures: Architectures, Avenues and Access
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2914 - 2916
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Linck, M., Hartel, P., Uhlemann, S., Kahl, F., Müller, H., Zach, J., Haider, M., Niestadt, M., Bischoff, M., Biskupek, J., Lee, Z., Lehnert, T., Börrnert, F., Rose, H., Kaiser, U., Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV, Phys. Rev. Lett. 117 (2016) 76101. https://doi.org/10.1103/PhysRevLett.117.076101.CrossRefGoogle ScholarPubMed
Egerton, R.F., Radiation damage to organic and inorganic specimens in the TEM, Micron. 119 (2019) 72–87. https://doi.org/10.1016/j.micron.2019.01.005.CrossRefGoogle ScholarPubMed
Quigley, F., Mcbean, P., O'Donovan, P., Peters, J., Jones, L., Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging, Microsc. Microanal. Accepted (in press) (2022).Google Scholar
Sawa, H., Anzai, M., Konishi, T., Tachibana, T., Hirayama, T., Development of a UHV-compatible Low-energy Electron Gun using the Photoelectric Effect, J. Vac. Soc. Japan. 60 (2017) 467–470. https://doi.org/10.3131/jvsj2.60.467.CrossRefGoogle Scholar
FQ is supported by a Trinity College Provost's Award scholarship. LJ is supported by Science Foundation Ireland grant number URF/RI/191637. The authors would like to acknowledge all the staff of the Advanced Microscopy Laboratory for their kind support and fruitful discussions.Google Scholar