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Beam Broadening Measured in Transmission Mode at Low Electron Energies in a Scanning Electron Microscope
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[3]The authors acknowledge funding by the Deutsche Forschungsgemeinschaft (DFG) under contract number Ge 841/20-2.Google Scholar
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