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Beam Blanking Studies in Environmental Scanning Electron Microscopy

Published online by Cambridge University Press:  01 August 2005

H Dobberstein ,
N J Purser ,
T W Fairhead ,
D J Stokes  and
R W Knowles
H Dobberstein
Affiliation:
University of Cambridge, United Kingdom
N J Purser
Affiliation:
University of Cambridge, United Kingdom
T W Fairhead
Affiliation:
University of Cambridge, United Kingdom
D J Stokes
Affiliation:
University of Cambridge, United Kingdom
R W Knowles
Affiliation:
FEI Company, Hillsboro, Oregon

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 400 - 401
Copyright
© 2005 Microscopy Society of America