Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Dunin-Borkowski, Rafal E.
Newcomb, Simon B.
Kasama, Takeshi
McCartney, Martha R.
Weyland, Matthew
and
Midgley, Paul A.
2005.
Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors.
Ultramicroscopy,
Vol. 103,
Issue. 1,
p.
67.
Formanek, Petr
and
Bugiel, Eberhard
2006.
Specimen preparation for electron holography of semiconductor devices.
Ultramicroscopy,
Vol. 106,
Issue. 4-5,
p.
365.
Kendrick, Anthony B
Moore, Thomas M
and
Zaykova-Feldman, Lyudmila
2006.
Mechanical Conversion for High-Throughput TEM Sample Preparation.
Journal of Physics: Conference Series,
Vol. 26,
Issue. ,
p.
227.
Langford, Richard
2007.
Focused Ion Beam Systems.
p.
215.
Dunin–Borkowski, R.E.
Kasama, T.
and
Harrison, R.J.
2007.
Nanocharacterisation.
p.
138.
Schaffer, Miroslava
Schaffer, Bernhard
and
Ramasse, Quentin
2012.
Sample preparation for atomic-resolution STEM at low voltages by FIB.
Ultramicroscopy,
Vol. 114,
Issue. ,
p.
62.
Dunin-Borkowski, Rafal E
Kasama, Takeshi
and
Harrison, Richard J
2015.
Nanocharacterisation.
p.
158.
Hayes, Garrett J.
and
Clemens, Bruce M.
2015.
Laser liftoff of gallium arsenide thin films.
MRS Communications,
Vol. 5,
Issue. 1,
p.
1.
Lotnyk, A.
Poppitz, D.
Ross, U.
Gerlach, J.W.
Frost, F.
Bernütz, S.
Thelander, E.
and
Rauschenbach, B.
2015.
Focused high- and low-energy ion milling for TEM specimen preparation.
Microelectronics Reliability,
Vol. 55,
Issue. 9-10,
p.
2119.
Giannuzzi, Lucille A.
Yu, Zhiyang
Yin, Denise
Harmer, Martin P.
Xu, Qiang
Smith, Noel S.
Chan, Lisa
Hiller, Jon
Hess, Dustin
and
Clark, Trevor
2015.
Theory and New Applications ofEx SituLift Out.
Microscopy and Microanalysis,
Vol. 21,
Issue. 4,
p.
1034.
Denisyuk, Andrey
Hrnčíř, Tomáš
Vincenc Oboňa, Jozef
Sharang
Petrenec, Martin
and
Michalička, Jan
2017.
Mitigating Curtaining Artifacts During Ga FIB TEM Lamella Preparation of a 14 nm FinFET Device.
Microscopy and Microanalysis,
Vol. 23,
Issue. 3,
p.
484.
Tait, C. Ryan
Yan, Lifan
and
Millunchick, Joanna M.
2018.
Spontaneous nanostructure formation in GaAsBi alloys.
Journal of Crystal Growth,
Vol. 493,
Issue. ,
p.
20.
Dunin-Borkowski, Rafal E.
Kovács, András
Kasama, Takeshi
McCartney, Martha R.
and
Smith, David J.
2019.
Springer Handbook of Microscopy.
p.
767.
Boureau, Victor
Durand, Aurèle
Gergaud, Patrice
Le Cunff, Delphine
Wormington, Matthew
Rouchon, Denis
Claverie, Alain
Benoit, Daniel
and
Hÿtch, Martin
2020.
Dark-field electron holography as a recording of crystal diffraction in real space: a comparative study with high-resolution X-ray diffraction for strain analysis of MOSFETs.
Journal of Applied Crystallography,
Vol. 53,
Issue. 4,
p.
885.
Seyring, M.
Wanierke, F.
Kaaden, T.
Lippmann, S.
and
Rettenmayr, M.
2021.
Influence of natural oxide layers at Ni/NiAl interfaces on Ni3Al phase formation.
Materials Characterization,
Vol. 174,
Issue. ,
p.
111032.
Zhang, Zijian
Wang, Wanting
Dong, Zuoyuan
Yang, Xin
Liang, Fang
Chen, Xinqian
Wang, Chaolun
Luo, Chen
Zhang, Jiayan
Wu, Xing
Sun, Litao
and
Chu, Junhao
2022.
The Trends of In Situ Focused Ion Beam Technology: Toward Preparing Transmission Electron Microscopy Lamella and Devices at the Atomic Scale.
Advanced Electronic Materials,
Vol. 8,
Issue. 9,
Lee, Hee-Beom
Jung, Min-Hyoung
Kim, Young-Hoon
Park, Eun-Byeol
Jang, Woo-Sung
Kim, Seon-Je
Choi, Ki-ju
Park, Ji-young
Hwang, Kee-bum
Shim, Jae-Hyun
Yoon, Songhun
and
Kim, Young-Min
2023.
Deep learning image segmentation for the reliable porosity measurement of high-capacity Ni-based oxide cathode secondary particles.
Journal of Analytical Science and Technology,
Vol. 14,
Issue. 1,
Castagna, Marc J
and
Klahn, Samuel
2023.
Geometric Failures in the Preparation a STEM/TEM Sample with a FIB/SEM.
Microscopy and Microanalysis,
Vol. 29,
Issue. Supplement_1,
p.
426.