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Auto-Tuning of Aberrations Using High-Resolution STEM Images by Auto-Correlation Function

Published online by Cambridge University Press:  09 April 2017

H Sawada ,
M Watanabe ,
E Okunishi  and
Y Kondo
H Sawada
Affiliation:
JEOL
M Watanabe
Affiliation:
Lehigh University
E Okunishi
Affiliation:
JEOL
Y Kondo
Affiliation:
JEOL

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1308 - 1309
Copyright
Copyright © Microscopy Society of America 2011