Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-25T03:45:44.741Z Has data issue: false hasContentIssue false
  • English
  • Français

AutoTEM 5 – Fully Automated TEM Sample Preparation for Materials Science

Published online by Cambridge University Press:  05 August 2019

M Dutka  and
A Prokhodtseva
M Dutka
Affiliation:
Thermo Fisher Scientific, Eindhoven, Netherlands.
A Prokhodtseva
Affiliation:
Thermo Fisher Scientific, Eindhoven, Netherlands.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 554 - 555
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Giannuzzi, LA et al. , Introduction to Focused Ion Beams (Springer).Google Scholar
[2]Alvis, R et al. , 38th International Symposium for Testing and Failure Analysis (2012) p. 391.Google Scholar