Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-26T05:32:56.849Z Has data issue: false hasContentIssue false

Automation of Image Processing for Nano-beam Diffraction Measurements

Published online by Cambridge University Press:  01 August 2018

Darren Homeniuk
Affiliation:
Nanotechnology Research Center, 11421 Saskatchewan Drive, T6G 2M9, Edmonton, Alberta, Canada
Francisco Paraguay Delgado
Affiliation:
Centro de Investigation en Materiales Avanzados S C Laboratorio Nacional de Nanotechnologia, Miguel de Cervantes 120, C P, 31136Chihuahua, Mexico
Marek Malac
Affiliation:
Nanotechnology Research Center, 11421 Saskatchewan Drive, T6G 2M9, Edmonton, Alberta, Canada Department of Physics, University of Alberta, T6G 2E1, Edmonton, Alberta, Canada
Misa Hayashida
Affiliation:
Nanotechnology Research Center, 11421 Saskatchewan Drive, T6G 2M9, Edmonton, Alberta, Canada

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Paraguay-Delgado, F., Malac, M. Alonso-Nunez, G. Materials Research Express 1 2014) p. 2446224467.Google Scholar
[2] Malac, M., et al, Ultramicroscopy 109 2008) p. 1421.Google Scholar
[3] Bergen, M., et al, Microscopy and Microanalysis 19 2012) p. 1395.Google Scholar