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Automated Image Acquisition at High Spatial Resolutions in a Field Emission Gun Scanning Electron Microscope

Published online by Cambridge University Press:  03 August 2008

J Blackson ,
CS Todd ,
G Bar ,
D Reuschle ,
M Janus ,
M Darus  and
A Nickles
J Blackson
Affiliation:
The Dow Chemical Company
CS Todd
Affiliation:
The Dow Chemical Company
G Bar
Affiliation:
Dow Olefinverbund GmbH, Germany
D Reuschle
Affiliation:
The Dow Chemical Company
M Janus
Affiliation:
FEI Company, Netherlands
M Darus
Affiliation:
FEI Company
A Nickles
Affiliation:
FEI Company
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1210 - 1211
Copyright
© 2008 Microscopy Society of America

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