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Automated Correlative Tomography of an Aluminum 7075 Alloy Spanning Length Scales and Modalities

Published online by Cambridge University Press:  23 September 2015

Arno P. Merkle
Affiliation:
Carl Zeiss X-ray Microscopy, Inc. 4385 Hopyard Road, Pleasanton, CA, USA
Lorenz Lechner
Affiliation:
Carl Zeiss X-ray Microscopy, Inc. 4385 Hopyard Road, Pleasanton, CA, USA
Luke Hunter
Affiliation:
Carl Zeiss X-ray Microscopy, Inc. 4385 Hopyard Road, Pleasanton, CA, USA
Jeff Gelb
Affiliation:
Carl Zeiss X-ray Microscopy, Inc. 4385 Hopyard Road, Pleasanton, CA, USA
S. S. Singh
Affiliation:
Arizona State University, 1151 S. Forest Ave., Tempe, AZ, USA
N. Chawla
Affiliation:
Arizona State University, 1151 S. Forest Ave., Tempe, AZ, USA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Burnett, T., et. al. Scientific Reports 2014.Google Scholar
[2] Merkle, A. P., et al., Microscopy and Analysis 28 (2014). p S10S13.Google Scholar
[3] Merkle, A. P. & Gelb, J., Microscopy Today 21 (2013). p 10.CrossRefGoogle Scholar
[4] Maire, E & Withers, P, International Materials Review 59 (2014). p 1.CrossRefGoogle Scholar
[5] Singh, S., et al., Mater. Res. Lett 2 (2014). p 217.Google Scholar