Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Kotula, Paul G.
and
Keenan, Michael R.
2006.
Application of Multivariate Statistical Analysis to STEM X-ray Spectral Images: Interfacial Analysis in Microelectronics.
Microscopy and Microanalysis,
Vol. 12,
Issue. 6,
p.
538.
Smentkowski, V. S.
Ostrowski, S. G.
Kollmer, F.
Schnieders, A.
Keenan, M. R.
Ohlhausen, J. A.
and
Kotula, P. G.
2008.
Multivariate statistical analysis of non‐mass‐selected ToF‐SIMS data.
Surface and Interface Analysis,
Vol. 40,
Issue. 8,
p.
1176.
Parish, Chad M.
and
Miller, Michael K.
2010.
Multivariate statistical analysis of atom probe tomography data.
Ultramicroscopy,
Vol. 110,
Issue. 11,
p.
1362.
Parish, C.M.
Capdevila, C.
and
Miller, M.K.
2010.
WITHDRAWN: A MVSA approach to mine information from APT data.
Ultramicroscopy,
Parish, Chad M.
2011.
Vol. 168,
Issue. ,
p.
249.
Kotula, Paul G.
Klenov, Dmitri O.
and
von Harrach, H. Sebastian
2012.
Challenges to Quantitative Multivariate Statistical Analysis of Atomic-Resolution X-Ray Spectral.
Microscopy and Microanalysis,
Vol. 18,
Issue. 4,
p.
691.
Parish, Chad M.
and
Miller, Michael K.
2015.
A review of advantages of high-efficiency X-ray spectrum imaging for analysis of nanostructured ferritic alloys.
Journal of Nuclear Materials,
Vol. 462,
Issue. ,
p.
433.
Kotula, Paul
2016.
Transmission Electron Microscopy.
p.
439.
Parish, Chad M.
Terrani, Kurt A.
Kim, Young-Jin
Koyanagi, Takaaki
and
Katoh, Yutai
2017.
Microstructure and hydrothermal corrosion behavior of NITE-SiC with various sintering additives in LWR coolant environments.
Journal of the European Ceramic Society,
Vol. 37,
Issue. 4,
p.
1261.