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Automated Acquisition and Analysis of Selected Area Electron Channeling Patterns in an FEG-SEM

Published online by Cambridge University Press:  04 August 2017

Joseph Tessmer ,
Saransh Singh ,
Yoosuf N. Picard  and
Marc DeGraef
Joseph Tessmer
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA, USA
Saransh Singh
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA, USA
Yoosuf N. Picard
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA, USA
Marc DeGraef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 550 - 551
Copyright
© Microscopy Society of America 2017 

References

[1] Singh, S. & De Graef, M. Microscopy and Microanalysis 2017). in press.Google Scholar
[2] Callahan, P. & De Graef, M. Microscopy and Microanalysis 19 2013). p. 1255.CrossRefGoogle Scholar
[3] Picard, Y., et al, Microscopy Today 20.02 2012). p. 12.CrossRefGoogle Scholar
[4] Research supported by an ONR grant, # N00014-16-1-2821. The authors acknowledge use of the Materials Characterization Facility at Carnegie Mellon University supported by grant MCF-677785..Google Scholar