Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-27T11:25:40.782Z Has data issue: false hasContentIssue false
  • English
  • Français

Auger Analysis Of Focused Ion Beam Prepared Lift -Out Specimens

Published online by Cambridge University Press:  01 August 2002

B.B. Rossie ,
R. M. Mills ,
S.D. Anderson ,
M. Antonell  and
F.A. Stevie
B.B. Rossie
Affiliation:
Agere Systems, 9333 South John Young Parkway, Orlando, FL 32819
R. M. Mills
Affiliation:
Agere Systems, 9333 South John Young Parkway, Orlando, FL 32819
S.D. Anderson
Affiliation:
Agere Systems, 9333 South John Young Parkway, Orlando, FL 32819
M. Antonell
Affiliation:
RF Micro Devices, 7625 Thorndike Rd., Greensboro, NC 27409
F.A. Stevie
Affiliation:
North Carolina State University, Box 7531, Raleigh, NC 27695

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 556 - 557
Copyright
Copyright © Microscopy Society of America 2002