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Atomic-Resolution Imaging of Graphene Using an Ultrahigh-vacuum Microscope with a High-brightness Electron Gun

Published online by Cambridge University Press:  30 July 2020

Hidetaka Sawada ,
Shigeyuki Morishita ,
Yuji Kohno ,
Takeo Sasaki ,
Masaki Mukai ,
Yung-Chang Lin ,
Ryosuke Senga  and
Kazu Suenaga
Hidetaka Sawada
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Shigeyuki Morishita
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Yuji Kohno
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Takeo Sasaki
Affiliation:
JEOL Ltd., Welwyn Garden City, England, United Kingdom
Masaki Mukai
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Yung-Chang Lin
Affiliation:
AIST, Tsukuba, Ibaraki, Japan
Ryosuke Senga
Affiliation:
AIST, Tsukuba, Ibaraki, Japan
Kazu Suenaga
Affiliation:
AIST, Tsukuba, Ibaraki, Japan

Abstract

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Type
New Frontiers in Electron Microscopy of Two-dimensional Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2358 - 2359
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Copyright
Copyright © Microscopy Society of America 2020

References

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