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Atomic-resolution electric field measurements with a universal detector

Published online by Cambridge University Press:  01 August 2018

Jordan A. Hachtel ,
Arashdeep Thind ,
Rohan Mishra ,
Juan Carlos Idrobo  and
Miaofang Chi
Jordan A. Hachtel
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN USA
Arashdeep Thind
Affiliation:
Institute of Materials Science and Engineering, Washington University, St. Louis, MO United States
Rohan Mishra
Affiliation:
Institute of Materials Science and Engineering, Washington University, St. Louis, MO United States Department of Mechanical Engineering and Materials Science, Washington University, St. Louis, MO United States
Juan Carlos Idrobo
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN USA
Miaofang Chi
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 114 - 115
Copyright
© Microscopy Society of America 2018 

References

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[5] Research supported by ORNL's Center for Nanophase Materials Sciences, which is a U.S. Department of Energy Office of Science User Facility.Google Scholar