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Atomic-level Chemical Analysis by EELS and XEDS in Aberration- corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2010

M Watanabe ,
E Okunishi  and
T Aoki
M Watanabe
Affiliation:
Lehigh University
E Okunishi
Affiliation:
JEOL Ltd
T Aoki
Affiliation:
JEOL USA

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 66 - 67
Copyright
Copyright © Microscopy Society of America 2010