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Atomically Resolved EELS Elemental and Fine Structure Mapping via Multi-Frame and Energy-Offset Correction Acquisition

Published online by Cambridge University Press:  01 August 2018

Yi Wang ,
Michael R. S. Huang ,
Ute Salzberger ,
Kersten Hahn ,
Wilfried Sigle  and
Peter A. van Aken
Yi Wang
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany
Michael R. S. Huang
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany
Ute Salzberger
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany
Kersten Hahn
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany
Wilfried Sigle
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany
Peter A. van Aken
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 448 - 449
Copyright
© Microscopy Society of America 2018 

References

[1] Wang, Y, et al, Ultramicroscopy 184 2018) p. 98.Google Scholar
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[5] Jones, L, et al Microscopy (2018) https://doi.org/10.1093/jmicro/dfx125.Google Scholar