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Atomic Structure of Y2O3:Eu/LaA1O3 Interfaces

Published online by Cambridge University Press:  02 July 2020

H-J. Gao ,
X.D. Fan ,
D. Kumar ,
K.G. Cho ,
R.K. Singh  and
S.J. Pennycook
H-J. Gao
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN37831-6030
X.D. Fan
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN37831-6030
D. Kumar
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL32611-6400
K.G. Cho
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL32611-6400
R.K. Singh
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL32611-6400
S.J. Pennycook
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN37831-6030
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Extract

There has been intense interest in preparing single crystalline yttrium oxide (Y2O3) thin films for applications in ultra-large scale integration (ULSI) gate insulators, ULSI capacitors, and, by addition of suitable dopant species, for electroluminescent devices. Y2O3 has a C-type rare-earth sesquioxide structure, closely related to the fluorite structure with a cell parameter a= 1.060 nm and space group Th (Ia3). LaAIO3 (LAO) is a rhombohedral structure with lattice parameters a = 0.378 nm, θ ≤ 90.5°. The lattice mismatch with the <110> direction of the YO is therefore less than 0.8%, and so we would anticipate epitaxial growth of single crystalline YO thin films on the LAO (001) substrate to be feasible. Eu activated YO thin films were deposited by laser ablation on (001) LAO substrates. TEM bright field images and electron diffraction patterns were recorded in a Philips EM-400 electron microscope operated at lOOkV. Z-contrast imaging was conducted in a VG HB603 STEM at 300kV. In this presentation, we will report the epitaxial growth of YO thin films doped with ∼ wt 4% Eu on a LaAlO3 substrate, and the atomic structure of the interface.

Type
Surfaces and Interfaces
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 1058 - 1059
Copyright
Copyright © Microscopy Society of America

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References

References:

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