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Atomic Structure of La067Ca0.33MnO3 Thin Films on LaAlO3

Published online by Cambridge University Press:  02 July 2020

H-J. Gao ,
C.L. Chen ,
X. Fan ,
M. Kim ,
S.Y. Chen ,
C.W. Chu  and
S.J. Pennycook
H-J. Gao
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN37831-6030
C.L. Chen
Affiliation:
Department of Physics and the Texas Center for Superconductivity, University of Houston, Houston, Texas77204
X. Fan
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN37831-6030
M. Kim
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN37831-6030
S.Y. Chen
Affiliation:
Department of Physics and the Texas Center for Superconductivity, University of Houston, Houston, Texas77204
C.W. Chu
Affiliation:
Department of Physics and the Texas Center for Superconductivity, University of Houston, Houston, Texas77204
S.J. Pennycook
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN37831-6030
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Extract

Thin films of doped perovskite manganites of the type R1-X AxMnO3-y are currently become the focus of intense theoretical and experimental research due to their promising technological implications. However, the microstructure of the film and the interface structure at the atomic level remains unclear. In this report, we will present the atomic structure of the film/substrate interface and the microstructure of the film using a combination of transmission electron microscopy (TEM), Z-contrast scanning transmission microscopy (STEM), and electron energy loss spectroscopy (EELS).

The La0.67Ca0.33MnO3 (LCMO) samples were grown on (001) LaA1O3 (LAO) using pulsed laser deposition. X-ray diffraction indicated the films to be oriented with the [001] directions parallel to the <001> directions of the pseudo-cubic perovskite LAO. Rocking curve measurements using the (002) reflection from the film indicated a full width half maximum of less than 0.3°. A Philips EM-400 electron microscope at 100 kV and a VG HB603 STEM at 300 kV were employed for sample analysis.

Type
Ceramics & Minerals
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 402 - 403
Copyright
Copyright © Microscopy Society of America

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References

References:

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4.Gao, H-J., et al., Appl. Phys. Lett, (to be published).Google Scholar