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Atomic Scale Structural and Chemical Quantification of Non-Stoichiometric Defects in Ti and Bi Doped BiFeO3

Published online by Cambridge University Press:  09 April 2017

L Wang ,
B Schaffer ,
A Craven ,
I MacLaren ,
S Miao  and
I Reaney
L Wang
Affiliation:
University of Glasgow, United Kingdom
B Schaffer
Affiliation:
Daresbury Laboratories, United Kingdom
A Craven
Affiliation:
University of Glasgow, United Kingdom
I MacLaren
Affiliation:
University of Glasgow, United Kingdom
S Miao
Affiliation:
University of Sheffield, United Kingdom
I Reaney
Affiliation:
University of Sheffield, United Kingdom

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1896 - 1897
Copyright
Copyright © Microscopy Society of America 2011