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Atomic Resolution Study of W-Doped VO2 Nanowires

Published online by Cambridge University Press:  23 September 2015

Hasti Asayesh-Ardakani
Affiliation:
Department of Mechanical Engineering-Engineering Mechanics, Michigan Technological University, Houghton, MI 49933-1295, USA Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059, USA
Anmin Nie
Affiliation:
Department of Mechanical Engineering-Engineering Mechanics, Michigan Technological University, Houghton, MI 49933-1295, USA Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059, USA
Peter M. Marley
Affiliation:
Department of Chemistry, University at Buffalo, State University of New York, Buffalo, New York, 14260-3000, USA
Yihan Zhu
Affiliation:
Advanced Membranes and Porous Materials Center, King Abdullah University of Science & Technology, Thuwal, 23955-6900, Kingdom of Saudi Arabia
Patrick J. Phillips
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059, USA
Sujay Singh
Affiliation:
Department of Physics, University at Buffalo, State University of New York, Buffalo, New York, 14260-3000, USA
Farzad Mashayek
Affiliation:
Department of Mechanical and Industrial Engineering, University of Illinois at Chicago, Chicago, IL60607-7059, USA
Ganapathy Sambandamurthy
Affiliation:
Department of Physics, University at Buffalo, State University of New York, Buffalo, New York, 14260-3000, USA
Ke-bin Low
Affiliation:
Research Resource Center, University of Illinois at Chicago, IL60607-7059, USA
Robert F. Klie
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059, USA
Sarbajit Banerjee
Affiliation:
Department of Chemistry, University at Buffalo, State University of New York, Buffalo, New York, 14260-3000, USA
Gregory M. Odegard
Affiliation:
Department of Mechanical Engineering-Engineering Mechanics, Michigan Technological University, Houghton, MI 49933-1295, USA
Reza Shahbazian-Yassar
Affiliation:
Department of Mechanical Engineering-Engineering Mechanics, Michigan Technological University, Houghton, MI 49933-1295, USA Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059, USA Department of Mechanical and Industrial Engineering, University of Illinois at Chicago, Chicago, IL60607-7059, USA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Morin, FJ, Phys Rev Lett 3 (1959). p. 34.Google Scholar
[2] Eyert, V, Ann Phys (Berlin) 11 (2002). p. 650.CrossRefGoogle Scholar