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Atomic Resolution Investigation of Ultra-Low Energy Ion-Implanted Monolayer TMDs Using Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Michael Hennessy ,
Eoin Moynihan ,
Eoghan O'Connell ,
Stefan Rost ,
Manuel Auge ,
Minh Bui ,
Beata Kardynal ,
Hans Hofsäss  and
Ursel Bangert
Michael Hennessy*
Affiliation:
Bernal Institute, University of Limerick, Ireland
Eoin Moynihan
Affiliation:
Bernal Institute, University of Limerick, Ireland
Eoghan O'Connell
Affiliation:
Bernal Institute, University of Limerick, Ireland
Stefan Rost
Affiliation:
Peter Grünberg Institute, FZJ, Jülich, Germany
Manuel Auge
Affiliation:
Georg-August-Universität Göttingen, Göttingen, Germany
Minh Bui
Affiliation:
Peter Grünberg Institute, FZJ, Jülich, Germany
Beata Kardynal
Affiliation:
Peter Grünberg Institute, FZJ, Jülich, Germany
Hans Hofsäss
Affiliation:
Georg-August-Universität Göttingen, Göttingen, Germany
Ursel Bangert
Affiliation:
Bernal Institute, University of Limerick, Ireland
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2538 - 2540
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Copyright
Copyright © Microscopy Society of America 2022

References

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