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Atom-by-Atom STEM Investigation of Defect Engineering in Graphene

Published online by Cambridge University Press:  27 August 2014

Q.M. Ramasse ,
D.M. Kepapstoglou ,
F.S. Hage ,
T. Susi ,
J. Kotakoski ,
C. Mangler ,
P. Ayala ,
J. Meyer ,
J.A. Hinks  and
S. Donnelly
...Show all authors
Q.M. Ramasse
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Keckwick Lane, Daresbury WA4 4AD, U.K
D.M. Kepapstoglou
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Keckwick Lane, Daresbury WA4 4AD, U.K
F.S. Hage
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Keckwick Lane, Daresbury WA4 4AD, U.K
T. Susi
Affiliation:
Faculty of Physics, University of Vienna, Strulhofgasse 4, A-1090 Vienna, Austria
J. Kotakoski
Affiliation:
Faculty of Physics, University of Vienna, Strulhofgasse 4, A-1090 Vienna, Austria Department of Physics, University of Helsinki, P.O. Box 43, FI-00014, Helsinki, Finland
C. Mangler
Affiliation:
Faculty of Physics, University of Vienna, Strulhofgasse 4, A-1090 Vienna, Austria
P. Ayala
Affiliation:
Faculty of Physics, University of Vienna, Strulhofgasse 4, A-1090 Vienna, Austria
J. Meyer
Affiliation:
Faculty of Physics, University of Vienna, Strulhofgasse 4, A-1090 Vienna, Austria
J.A. Hinks
Affiliation:
School of Computing and Engineering, University of Huddersfield, Huddersfield HD1 3DH, U.K
S. Donnelly
Affiliation:
School of Computing and Engineering, University of Huddersfield, Huddersfield HD1 3DH, U.K
R. Zan
Affiliation:
School of Materials, University of Manchester, Manchester M13 3PL, U.K
C.T. Pan
Affiliation:
School of Materials, University of Manchester, Manchester M13 3PL, U.K
S.J. Haigh
Affiliation:
School of Materials, University of Manchester, Manchester M13 3PL, U.K
U. Bangert
Affiliation:
School of Materials, University of Manchester, Manchester M13 3PL, U.K Department of Physics and Energy, University of Limerick, Limerick, Ireland

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1736 - 1737
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Bangert, U., Pierce, W., Ramasse, Q.M. et al.,, Nano Letters 13 (2013), pp. 4902-4907.Google Scholar
[2] Pan, C.-T., Hinks, J.A., Ramasse, Q.M., Greaves, G., Bangert, U., Donnelly, S.E. and Haigh, S.J. Submitted (2014).Google Scholar
[3] Susi, T., Kotakoski, J., Kepaptsoglou, D., Mangler, C., Lovejoy, T.C., Krivanek, O.L., Zan, R., Bangert, U., Ayala, P., Meyer, J.C. and Ramasse, Q.M. Submitted (2014).Google Scholar
[4] Ramasse, Q.M., Seabourne, C.R., Kepaptsoglou, D.M., et al., Nano Letters 13 (2013), 4989-4985.Google Scholar
[5] Hage, F.S., Ramasse, Q.M., Kepaptsoglou, D.M., et al., Physical Review B 88 (2013), 155408.Google Scholar
[6] Hage, F.S., Kepaptsoglou, D.M., Seabourne, C.R., et al., Nanoscale 6 (2014), p. 1833-1839.Google Scholar
[7] SuperSTEM is funded by the UK Engineering and Physical Sciences Research Council (EPSRC).Google Scholar