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Atom Probe Tomography and analytical Scanning Transmission Electron Microscopy of Rapid Solidification Microstructures in Al-Cu Alloy Thin Films

Published online by Cambridge University Press:  04 August 2017

Jorg M.K. Wiezorek ,
Kai W. Zweiacker ,
Can Liu ,
Isabelle Martin ,
Ty. J. Prosa  and
David J. Larson
Jorg M.K. Wiezorek
Affiliation:
Department of Mechanical Engineering and Materials Science, Swanson School of Engineering, University of Pittsburgh, Pittsburgh, PA, USA.
Kai W. Zweiacker
Affiliation:
Department of Mechanical Engineering and Materials Science, Swanson School of Engineering, University of Pittsburgh, Pittsburgh, PA, USA. Now: EMPA, Swiss Federal Laboratories for Materials Science and Technology, Dubendorf, Switzerland.
Can Liu
Affiliation:
Department of Mechanical Engineering and Materials Science, Swanson School of Engineering, University of Pittsburgh, Pittsburgh, PA, USA.
Isabelle Martin
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA.
Ty. J. Prosa
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA.
David J. Larson
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 688 - 689
Copyright
© Microscopy Society of America 2017 

References

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[7] Larson, D. J., et al., Local Electrode Atom Probe Tomography. Springer New York 2013.Google Scholar
[8] The authors acknowledge funding from the National Science Foundation, Grants NSF-1105757 and NSF-1607922.Google Scholar