Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-28T14:33:43.019Z Has data issue: false hasContentIssue false
  • English
  • Français

Atom Probe Tomography: A Technique for Nanoscale Characterization

Published online by Cambridge University Press:  01 November 2002

M. K. Miller  and
E. A. Kenik
M. K. Miller
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6136
E. A. Kenik
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6136

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1126 - 1127
Copyright
Copyright © Microscopy Society of America 2002