Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-02T22:25:08.130Z Has data issue: false hasContentIssue false
  • English
  • Français

Atom Probe Field Ion Microscopy of Poly Synthetically Twinned Titanium Aluminide

Published online by Cambridge University Press:  02 July 2020

D. J. Larson ,
M. K. Miller ,
H. Inui  and
M. Yamaguchi
D. J. Larson
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831-6376
M. K. Miller
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831-6376
H. Inui
Affiliation:
Dept. of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto, 606-01, Japan
M. Yamaguchi
Affiliation:
Dept. of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto, 606-01, Japan
Get access

Extract

Two phase γ-based TiAl alloys are attractive for structural applications at high temperatures because they possess good elevated-temperature mechanical properties, low density, and good creep and oxidation resistance. The microstructures of these alloys consist of plates of the near equiatomic γ phase (L10-ordered structure) and the Ti3Al α2 phase (D019-ordered structure). It is of great interest to study the details of the lamellar α2+γ microstructure because the interface stability is the key to providing a usable high temperature material.

Polysynthetically twinned (PST) TiAl crystals have been developed in order to systematically study the lamellar microstructure. These PST materials contain no high angle grain boundaries and have an single set of aligned lamellae of a α2 and γ phases, as shown in Fig. 1. Therefore, PST samples facilitate the study of the dependence of mechanical properties on lamellar structure by providing a known, consistent set of aligned lamellae.

Type
Imaging and Analysis at the Atomic Level: 30 Years of Atom Probe Field Ion Microscopy
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 102 - 103
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Inui, H. et al., Acta Metall. et Mater. 40 (1992) 3095.CrossRefGoogle Scholar

2. Inui, H. et al., Phil. Mag. A 74 (1996) 451.CrossRefGoogle Scholar

3. This research was sponsored by the Division of Materials Sciences, U. S. Department of Energy, under contract DE-AC05-960R22464 with Lockheed Martin Energy Research Corp. and by an appointment (DJL) to the Oak Ridge National Laboratory (ORNL) Postdoctoral Research Associates Program administered jointly by the Oak Ridge Institute for Science and Education and ORNL. This research was conducted utilizing the Shared Research Equipment (SHaRE) User Program facilities at ORNL.Google Scholar