Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-29T01:03:10.841Z Has data issue: false hasContentIssue false
  • English
  • Français

Asymmetric Temperature Profiles in Joule-Heated in Aluminum Nanowires

Published online by Cambridge University Press:  25 July 2016

B. C. Regan ,
Brian Zutter ,
William A. Hubbard ,
Shaul Aloni  and
Matthew Mecklenburg
B. C. Regan
Affiliation:
Department of Physics and Astronomy & California NanoSystems Institute, University of California, Los Angeles, CA, USA
Brian Zutter
Affiliation:
Department of Physics and Astronomy & California NanoSystems Institute, University of California, Los Angeles, CA, USA
William A. Hubbard
Affiliation:
Department of Physics and Astronomy & California NanoSystems Institute, University of California, Los Angeles, CA, USA
Shaul Aloni
Affiliation:
Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Matthew Mecklenburg
Affiliation:
Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles, CA, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 772 - 773
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Mecklenburg, M, et al, Science 347 (2015). p. 629–632.Google Scholar
[2] Seah, M P & Smith, G C Journal of Materials Science 21 (1986). p. 1305–1309.CrossRefGoogle Scholar
[3] De, D, et al, Journal of Applied Physics 54 (1983). p. 4022–4027.Google Scholar
[4] This work was supported by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA. Data presented were acquired at the Center for Electron Microscopy and Microanalysis at the University of Southern California.Google Scholar