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APS 2-ID Microprobes: Status and Future Plans

Published online by Cambridge University Press:  10 August 2018

Barry Lai*
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL
Dana Capatina
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL
Chris Roehrig
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL
Olga Antipova
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL
Zhonghou Cai
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL
Si Chen
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL
Junjing Deng
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL
*
*Corresponding author, [email protected]

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Cai, Z., Lai, B., Yun, W., Ilinski, P., Legnini, D., Maser, J. Rodrigues, W. AIP Proc. 507 (X-Ray Microscopy VI), 472-477 (2000).Google Scholar
[2] Jeffrey, A. Klug, et al, this proceeding.Google Scholar
[3] Si Chen, , et al, J. Synchrotron. Rad 21, 6675, 2014.CrossRefGoogle Scholar
[4] This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357..Google Scholar