Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-26T08:38:03.200Z Has data issue: false hasContentIssue false
  • English
  • Français

Applications of spherical aberration correction in STEM and TEM

Published online by Cambridge University Press:  01 August 2010

S Lazar ,
J Etheridge ,
C Dwyer ,
B Freitag  and
GA Botton
S Lazar
Affiliation:
Canadian Centre for Electron Microscopy, Canada
J Etheridge
Affiliation:
Monash University, Australia
C Dwyer
Affiliation:
Monash University, Australia
B Freitag
Affiliation:
FEI Electron Optics, The Netherlands
GA Botton
Affiliation:
McMaster University, Canada

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 68 - 69
Copyright
Copyright © Microscopy Society of America 2010