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Applications of MeV ion beams and microscopy to non-destructive surface analysis of materials

Published online by Cambridge University Press:  10 September 2015

J. Pacheco de Carvalho ,
C. F. R. Pacheco  and
A. D. Reis
J. Pacheco de Carvalho
Affiliation:
Departamento de Física, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal
C. F. R. Pacheco*
Affiliation:
Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal
A. D. Reis
Affiliation:
Departamento de Física, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal
*
E-mail : pacheco@ubipt

Abstract

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Type
Material Sciences
Information
Microscopy and Microanalysis , Volume 21 , Supplement S6: Introduction to the SPMicros Special Issue from the XLVII Annual Congress , August 2015 , pp. 122 - 123
Copyright
Copyright © Microscopy Society of America 2015 

References

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