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Applications of Low Dose Electron Ptychography.

Published online by Cambridge University Press:  22 July 2022

AI Kirkland ,
J. S. Kim ,
C. S. Allen ,
C. Huang ,
E Liberti ,
CM O'Leary ,
P. D. Nellist  and
P. Wang
AI Kirkland*
Affiliation:
Department of Materials, University of Oxford, Oxford, UK Rosalind Franklin Institute, Harwell Science and Innovation Campus, Didcot, UK Electron Physical Sciences Imaging Centre, Diamond Light Source Ltd., Harwell Science and Innovation Campus, Didcot, UK
J. S. Kim
Affiliation:
Department of Materials, University of Oxford, Oxford, UK Rosalind Franklin Institute, Harwell Science and Innovation Campus, Didcot, UK
C. S. Allen
Affiliation:
Department of Materials, University of Oxford, Oxford, UK Electron Physical Sciences Imaging Centre, Diamond Light Source Ltd., Harwell Science and Innovation Campus, Didcot, UK
C. Huang
Affiliation:
Rosalind Franklin Institute, Harwell Science and Innovation Campus, Didcot, UK
E Liberti
Affiliation:
Rosalind Franklin Institute, Harwell Science and Innovation Campus, Didcot, UK
CM O'Leary
Affiliation:
Department of Physics, University of California, Loss Angeles, Los Angeles, CA, United States
P. D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
P. Wang
Affiliation:
Department of Physics, University of Warwick, Coventry CV4 7AL, UK
*
*Corresponding author: [email protected]

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 352 - 354
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Copyright
Copyright © Microscopy Society of America 2022

References

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