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Application of Low kV EELS to Problematic Samples

Published online by Cambridge University Press:  05 August 2019

Eric V. Formo ,
Jane Y. Howe ,
Takeshi Sunaoshi ,
Atsushi Muto ,
Jim Kilcrease  and
Tina Salguero
Eric V. Formo
Affiliation:
Georgia Electron Microscopy, University of Georgia, Athens, Georgia, USA.
Jane Y. Howe
Affiliation:
Hitachi High Technologies America Inc., Clarksburg, Maryland, USA.
Takeshi Sunaoshi
Affiliation:
Hitachi High Technologies America Inc., Clarksburg, Maryland, USA.
Atsushi Muto
Affiliation:
Hitachi High Technologies America Inc., Clarksburg, Maryland, USA.
Jim Kilcrease
Affiliation:
Hitachi High Technologies America Inc., Clarksburg, Maryland, USA.
Tina Salguero
Affiliation:
Georgia Electron Microscopy, University of Georgia, Athens, Georgia, USA. Department of Chemistry, University of Georgia, Athens, Georgia, USA.

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 466 - 467
Copyright
Copyright © Microscopy Society of America 2019 

References

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[10]Special thanks to Dr. Roshini Ramachandran for preparing the LaB6 sample, to Mayra Pedraza for preparing the Li4Ti5O12 sample, and to Prof. Aaron Thompson for providing the soil sample for analysis.Google Scholar