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Application of High Energy-resolution Silicon Drift Detectors (SDD) for Quantitative Light Element Analysis

Published online by Cambridge University Press:  06 August 2003

Ralf Terborg  and
Martin Rohde
Ralf Terborg
Affiliation:
RÖNTEC GmbH, Schwarzschildstr. 12, D-12489 Berlin, Germany
Martin Rohde
Affiliation:
RÖNTEC GmbH, Schwarzschildstr. 12, D-12489 Berlin, Germany

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 120 - 121
Copyright
Copyright © Microscopy Society of America 2003