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Application of Exit-Plane Wave Function Images in High-Resolution Transmission Microscopy for Compositional Analysis of III-V Semiconductor Interfaces

Published online by Cambridge University Press:  01 August 2005

K Mahalingam ,
K Eyink ,
G Brown ,
D Dorsey ,
C Kisielowski  and
A Thust
K Mahalingam
Affiliation:
Air Force Research Laboratory, Wright–Patterson AFB, Ohio
K Eyink
Affiliation:
Air Force Research Laboratory, Wright–Patterson AFB, Ohio
G Brown
Affiliation:
Air Force Research Laboratory, Wright–Patterson AFB, Ohio
D Dorsey
Affiliation:
Air Force Research Laboratory, Wright–Patterson AFB, Ohio
C Kisielowski
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California
A Thust
Affiliation:
Institut für Festkörperforschung, Jülich, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 558 - 559
Copyright
© 2005 Microscopy Society of America