Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-27T10:47:29.376Z Has data issue: false hasContentIssue false
  • English
  • Français

Application of ESEM/Eds to Pharmaceutical Synthesis

Published online by Cambridge University Press:  02 July 2020

R. A. Carlton ,
E. Orton  and
C. E. Lyman
R. A. Carlton
Affiliation:
Pharmaceutical Research and Development, Rhone-Poulenc Rorer, College ville, PA, 19438
E. Orton
Affiliation:
Pharmaceutical Research and Development, Rhone-Poulenc Rorer, College ville, PA, 19438
C. E. Lyman
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, 18015
Get access

Extract

Solid phase synthesis (SPS) is used for the discovery and optimization of biologically active substances for the pharmaceutical and agricultural industries. Large numbers of novel organic compounds are generated by successively adding functional groups onto a solid substrate - usually polystyrene. Several techniques have been applied to the qualitative and quantitative analysis of these polymer-bound compounds with varying success. Environmental scanning electron microscopy (ESEM) with energy dispersive x-ray spectrometry (EDS) offers a unique approach to the qualitative analysis of SPS resins. Heteroatoms (such as Cl, Br, and S) are added either as a part of the synthesis or as a marker for analysis. Heavier atoms, such as these, are easily detected by EDS. The advantages of EDS are speed, sensitivity, and small required weight of the sample. The advantages of the ESEM are that it eliminates the need for a conductive coating and the vacuum conditions are not as severe on the specimen as with a conventional SEM.

Type
Environmental SEM
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1201 - 1202
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Fruchtel, J. S. and Jung, G., Angew. Chem. Int. Ed. Engl. 35 (1996)17.10.1002/anie.199600171CrossRefGoogle Scholar
2.Bolon, R. B. R B, in Howitt, D.G., Ed., Microbeam Analysis (1991)199.Google Scholar
3.Griffin, B. J., 50th Annual Meeting of the Electron Microscopy Society of America (Eds.: Bailey, Bentley & Small), (1992) 1324.Google Scholar
4.The authors gratefully acknowledge the contributions to this work by James Roberts at Lehigh University and David-Toledo Velasquez at Rhone-Poulenc Rorer.Google Scholar