Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-28T18:44:59.912Z Has data issue: false hasContentIssue false
  • English
  • Français

Application of Atom Probe Tomography to Nitride Semiconductors

Published online by Cambridge University Press:  04 August 2017

Rachel A. Oliver ,
Fengzai Tang ,
Samantha E. Bennett ,
Tomas L. Martin ,
Paul A.J. Bagot ,
GDW Smith  and
Michael P. Moody
Rachel A. Oliver
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, United Kingdom
Fengzai Tang
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, United Kingdom
Samantha E. Bennett
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, United Kingdom
Tomas L. Martin
Affiliation:
Departments of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom
Paul A.J. Bagot
Affiliation:
Departments of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom
GDW Smith
Affiliation:
Departments of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom
Michael P. Moody
Affiliation:
Departments of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 666 - 667
Copyright
© Microscopy Society of America 2017 

References

[1] Narukawa, Y, et al, Appl. Phys. Lett. 70 1997 981.Google Scholar
[2] Smeeton, TM, et al, Appl. Phys. Lett. 83 2003 5419.Google Scholar
[3] Galtrey, MJ, et al, J. Appl. Phys. 104 2008 013524.Google Scholar
[4] Kisielowski, C & Battel, TP Appl. Phys. Lett. 91 2007 176101.Google Scholar
[5] Bennett, SE, et al, Appl. Phys. Lett. 99 2011 021906.Google Scholar
[6] Tang, F., et al, Appl. Phys. Lett. 106 2015 072104.Google Scholar
[7] Schulz, S., et al, Phys. Rev. B 92 2015 235419.CrossRefGoogle Scholar
[8] Tang, F., et al, Microscopy and Microanalysis 21 2015 544.Google Scholar
[9] Bennett, SE, et al, Ultramicroscopy 111 2011 207.Google Scholar
[10] Mazumder, B., et al, Appl. Phys. Lett. 101 2012 091601.Google Scholar
[11] Rigutti, L, et al, Scripta Materialia 2017). In Press. DOI: 10.1016/j.scriptamat.2016.12.034.Google Scholar