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Application of Atom Probe Microanalysis for Understanding Microstructure Evolution in Nickel Base Superalloy Welds

Published online by Cambridge University Press:  02 July 2020

S. S. Babu
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, MS-6096, PO Box 2008, Oak Ridge, TN37831-6096
S. A. David
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, MS-6096, PO Box 2008, Oak Ridge, TN37831-6096
M. K. Miller
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, MS-6096, PO Box 2008, Oak Ridge, TN37831-6096
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Extract

The characterization of the microstructure evolution during welding of nickel base superalloys is required for efficient reuse and reclamation of used and failed components. Previous atom probe analysis of electron-beam and laser-beam welds revealed complex alloying elemental partitioning between the γ and γ phases. Rapid cooling conditions in the weld leads to non-equilibrium partitioning and large amplitude Cr and Co levels in the γ phase. These results indicated that there is a strong relationship between weld cooling rate and the precipitation of γ′ precipitates from the γ phase. To understand and develop predictive models, a systematic investigation of the microstructure evolution in CM247DS alloy under controlled thermomechanical conditions are being performed. This paper describes some recent results on the elemental partitioning between γ and γ′ phases obtained with atom probe microanalysis.

Type
Phase Transformations
Copyright
Copyright © Microscopy Society of America

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References

1.David, S. A. et al., Sci. Tech. Weld. Join. 2 (1997) 79.CrossRefGoogle Scholar
2.Babu, S. S. et al., Microscopy and Microanalysis 4 (1998) 94.CrossRefGoogle Scholar
3.Miller, M. K. et al., Atom Probe field Ion Microscopy, Oxford University Press, 1996.Google Scholar
4.Miller, M. K.Atom Probe Tomography: Analysis at atomic level, Kluwer Academic / Plenum Publishers New York, 2000.CrossRefGoogle Scholar
5. Research at the Oak Ridge National Laboratory SHaRE User Facility was sponsored by the Division of Materials Sciences, U.S. Department of Energy, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corporation.Google Scholar