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Apfim and HREM Studies of Nanocomposite Soft and Hard Magnetic Materials

Published online by Cambridge University Press:  02 July 2020

K. Hono
Affiliation:
National Research of Institute for Metals, 1-2-1 Sengen, Tsukuba, 305, Japan
D. H. Ping
Affiliation:
National Research of Institute for Metals, 1-2-1 Sengen, Tsukuba, 305, Japan
M. Ohnuma
Affiliation:
National Research of Institute for Metals, 1-2-1 Sengen, Tsukuba, 305, Japan
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Extract

Atom probe field ion microscopy is the most suitable technique for determining local chemical composition changes during nanocrystallization processes of amorphous alloys. In this talk, we report atom probe field ion microscopy (APFIM) and high resolution electron microscopy (HREM) studies on nanocrystallization processes in Fe-Si-B-Nb-Cu soft magnet and Fe-Nd-B-Co-Ga exchange spring magnet.

Fe or Co based alloys with nanocrystalline microstructure show excellent permeability because the net magnetocrystalline anisotropy is significantly reduced when the grain size becomes smaller than the ferromagnetic exchange length. Fe-Si-B-Nb-Cu alloy is the pioneering nanocrystalline soft magnetic material invented by Yoshizawa et al. in 1988 [1]. Our previous works [2,3] reported evidence for clustering of Cu prior to the onset of the crystallization reaction. However, in the previous studies, it was not confirmed that these Cu clusters work as heterogeneous nucleation sites for a-Fe primary crystals.

Type
Imaging and Analysis at the Atomic Level: 30 Years of Atom Probe Field Ion Microscopy
Copyright
Copyright © Microscopy Society of America

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References

1.Yoshizawa, Y., Oguma, S. and Yamauchi, K., J. Appl. Phys. 64, 6040 (1988).Google Scholar
2.Hono, K., Hiraga, K., Wang, Q., Inoue, A. and Sakurai, T., Acta Metall. Mater., 40, 2137 (1992).CrossRefGoogle Scholar
3.Hono, K., Li, J-L., Ueki, Y., Inoue, A. and Sakurai, T., Appl. Surf. Sci. 67, 398 (1993).CrossRefGoogle Scholar
4.Kneller, E. F. and Hawig, R., IEEE Trans. Magn. 27, 3588(1991).CrossRefGoogle Scholar
5.Hirosawa, S. and Kanekiyo, H., IEEE Trans. Magn. 29, 2863 (1993).Google Scholar