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Anomalies in the Hough Transform of Kikuchi Bands in EBSD

Published online by Cambridge University Press:  02 July 2020

Xiaodong Tao
Affiliation:
Department of Material Science and Engineering, Lehigh University, 18015
Alwyn Eades
Affiliation:
Department of Material Science and Engineering, Lehigh University, 18015
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Abstract

The Hough Transform is widely used to detect linear features in image processing techniques. However, the features sought in the EBSD patterns are typically Kikuchi bands from low-index crystal planes, which are not lines but are bands of above average intensity bordered by dark bands. This gives rise to a characteristic shaped peak in the Hough transform that has been called the “butterfly” shape. in most cases, to reduce noise, the Hough Transform is convoluted with a mask having a matching “butterfly” shape. Unfortunately, this method sacrifices resolution through averaging the intensity of neighboring pixels. We have been concerned to use the Hough transform to locate the position of the Kikuchi bands with the highest possible precision. in order to achieve this goal we have looked into the way the Hough transform works on Kikuchi bands in detail, and found some anomalies that must be considered if accuracy is to be achieved.

Type
Diffraction Techniques in TEM and SEM
Copyright
Copyright © Microscopy Society of America 2001

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References

1.Krieger Lassen, N.C., Jesson, D.J. and Conradson, K.., Scanning Microscopy, 6, (1992) P115121Google Scholar
2. Support from DOE, under grant DE-FG02-00ER45819, is gratefully acknowledged.Google Scholar