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Annealing Effects on the Phase and Electronic Structure Evolutions of SiO Film by Electron Energy Loss Spectroscopy

Published online by Cambridge University Press:  31 July 2006

J Wang ,
XF Wang ,
A Meldrum  and
Q Li
J Wang
Affiliation:
The Chinese University of Hong Kong
XF Wang
Affiliation:
The Chinese University of Hong Kong
A Meldrum
Affiliation:
University of Alberta
Q Li
Affiliation:
The Chinese University of Hong Kong

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 642 - 643
Copyright
© 2006 Microscopy Society of America