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Anin situMethod for Preserving Buried Voids and Cracks During TEM Sample Preparation using FIB

Published online by Cambridge University Press:  25 July 2016

X. L. Zhong ,
P.J. Withers  and
M. G. Burke
X. L. Zhong
Affiliation:
Electron Microscopy Centre and Materials Performance Centre, School of Materials, University of Manchester, Manchester M13 9PL, UK
P.J. Withers
Affiliation:
Electron Microscopy Centre and Materials Performance Centre, School of Materials, University of Manchester, Manchester M13 9PL, UK
M. G. Burke
Affiliation:
Electron Microscopy Centre and Materials Performance Centre, School of Materials, University of Manchester, Manchester M13 9PL, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 186 - 187
Copyright
© Microscopy Society of America 2016 

References

[1]. Lechne, L., Biskupek, J. & Kaiser, U. Microsc Microanal 18 (2012). p. 379–384.Google Scholar
[2]. Phaneuf, M.W. Micron 30(3 (1999). p. 277–288.Google Scholar
[3] Giannuzzi, L.A. & Stevie, F.A. Micron 30 (1999). p. 197–204.Google Scholar
[4] The authors thank Mr. Y. Fan and Dr. Z Liu for providing the composite specimens for evaluation.Google Scholar