Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-12-01T04:58:39.379Z Has data issue: false hasContentIssue false
  • English
  • Français

Analyzing the Light Elements in an Electron Probe Micro Analyzer

Published online by Cambridge University Press:  02 July 2020

G.F. Bastin  and
H.J.M. Heijligers
G.F. Bastin
Affiliation:
Laboratory of Solid State and Materials Chemistry, University of Technology, P.O. Box 513, NL-5600, MB, Eindhoven, The Netherlands.
H.J.M. Heijligers
Affiliation:
Laboratory of Solid State and Materials Chemistry, University of Technology, P.O. Box 513, NL-5600, MB, Eindhoven, The Netherlands.
Get access

Extract

Wavelength-dispersive analysis of the ultra-light elements boron, carbon, nitrogen, and oxygen requires much more complicated experimental procedures than the analysis of medium-to-high Z (Z >11) elements. For a large part this is the result of a number of fundamental physical problems which cannot be circumvented. The most difficult problems of this nature are those related to the differences in the x-ray emission profiles from one ultra-light element compound to another. These differences are caused by the fact that in exciting ultra-light element x-rays electronic transitions of the bonding electrons are involved. As a consequence one has to deal with large peak shifts and large peak shape alterations in WDS analysis of ultra-light elements. While peak shifts can easily be accounted for by simply retuning the spectrometer when moving from standard to specimen the effects of peak shape alterations are much more difficult to deal with and in general it is imperative to perform the intensity measurements in an integral fashion.

Type
Problem Elements and Spectrometry Problems in X-Ray Microanalysis
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 220 - 221
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Bastin, G.F. and Heijligers, H.J.M., in Heinrich, K.F.J. and Newbury, D.E., Eds., “Electron Probe Quantitation”, Plenum Press, New York (1991, 145.CrossRefGoogle Scholar
2.Bastin, G.F. and Heijligers, H.J.M., in Williams, D., Goldstein, J., and Newbury, D., Eds., “X-Ray Spectrometry in Electron Beam Instruments”, Plenum Press, New York (1995), 239.CrossRefGoogle Scholar
3.Wiech, G., “X-ray emission spectroscopy”, Nato Adv. Study Inst., Day, P., Ed., Emission and Scattering Techniques Ser. C., (1981), 103.CrossRefGoogle Scholar
4.Bastin, G.F. and Heijligers, H.J.M., Microbeam Analysis, Ed. Newbury, D. E., San Francisco Press, (1988), 325.Google Scholar