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Analysis of Strain Localization at High Angle Grain Boundaries During Creep of a Polycrystalline Superalloy Using SEM-Based Digital Image Correlation

Published online by Cambridge University Press:  25 July 2016

C.E. Slone  and
M.J. Mills
C.E. Slone
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH
M.J. Mills
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 2018 - 2019
Copyright
© Microscopy Society of America 2016 

References

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[7] This material is based upon work supported by the National Science Foundation Graduate Research Fellowship Program under Grant No. DGE-1343012. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the authors and do not necessarily reflect the views of the National Science Foundation.Google Scholar