Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-26T20:27:08.682Z Has data issue: false hasContentIssue false
  • English
  • Français

Analysis of Experimental Error in High Resolution Electron Micrographs

Published online by Cambridge University Press:  31 January 2003

Geoffrey H. Campbell ,
Wayne E. King  and
Dov Cohen
Geoffrey H. Campbell
Affiliation:
Lawrence Livermore National Laboratory, Chemistry and Materials Science Directorate, Livermore, CA 94550
Wayne E. King
Affiliation:
Lawrence Livermore National Laboratory, Chemistry and Materials Science Directorate, Livermore, CA 94550
Dov Cohen
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455
Get access

Abstract

Analysis of Experimental Error in High Resolution Electron Micrographs

Type
Research Article
Information
Microscopy and Microanalysis , Volume 3 , Issue 5 , September 1997 , pp. 451 - 457
Copyright
2001 Cambridge University Press

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)