Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-24T15:58:46.977Z Has data issue: false hasContentIssue false
  • English
  • Français

An Image Evaluation System Coupled with Auto-TEM

Published online by Cambridge University Press:  24 July 2003

N. Nakamura ,
Y. Fujiyoshi ,
K. Mitsuoka ,
K. Murata  and
T. Shinkawa
N. Nakamura
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo 196-8558 , Japan
Y. Fujiyoshi
Affiliation:
Kyoto University, Oiwake-cho, Kitashirakawa, Sakyo-ku, Kyoto 606-8502 , Japan Agency of Industrial Science and Technology, 2-41-6, Aomi, Koto-ku, Tokyo 135-0064 , Japan
K. Mitsuoka
Affiliation:
Kyoto University, Oiwake-cho, Kitashirakawa, Sakyo-ku, Kyoto 606-8502 , Japan
K. Murata
Affiliation:
Agency of Industrial Science and Technology, 2-41-6, Aomi, Koto-ku, Tokyo 135-0064 , Japan
T. Shinkawa
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo 196-8558 , Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1038 - 1039
Copyright
Copyright © Microscopy Society of America 2003