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Aluminum Nanoparticles as Fiducials for Nanoscale Temperature Measurements

Published online by Cambridge University Press:  25 July 2016

Matthew Mecklenburg ,
Brian Zutter  and
B. C. Regan
Matthew Mecklenburg
Affiliation:
Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles, CA, USA
Brian Zutter
Affiliation:
Department of Physics and Astronomy & California NanoSystems Institute, University of California, Los Angeles, CA, USA
B. C. Regan
Affiliation:
Department of Physics and Astronomy & California NanoSystems Institute, University of California, Los Angeles, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 830 - 831
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Mecklenburg, M, et al, Science 347 (2015). p. 629–632.Google Scholar
[2] Meyer, G Zeitschrift fur Physik 148 (1957). p. 61–71.Google Scholar
[3] Wilson, A J C Proceedings of the Physical Society 54 (1941). p. 235–244.Google Scholar
[4] This work was supported in part by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA. The data were acquired at the FEI NanoPort (Oregon, USA) using a FEI Titan Themis 80-200.Google Scholar