AFM and Other Scanned Probe Microscopies Tutorial

Extract

While the techniques offer high spatial resolution in some cases down to the atomic scale and three dimensional mapping of surface topography, there still remain issues related to quantitative interpretation of scanned probe data, particularly in the recently developed phase contrast imaging modes. In this talk, the various modes of force microscopy will be introduced, along with examples. New techniques are starting to emerge which allow us to use the scanned probe microscope to measure properties such as local adhesion and local elastic and plastic deformation of samples.

Each scanned probe technique relies on a very sharp probe positioned within a few nanometers of the surface of interest. Some combination of probe and/or substrate positioning is required to provide sub-nm-resolution, three-dimensional motion of the probe relative to the substrate. When the probe translates laterally (horizontally) relative to the sample, any change in the height of the surface causes the detected probe signal to change.