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Advancing Correlative STEM Analysis Methods for FE-SEM

Published online by Cambridge University Press:  04 August 2017

David C. Bell ,
Natasha Erdman  and
Masateru Shibata
David C. Bell
Affiliation:
Harvard John A. Paulson School of Engineering and Applied Sciences, Harvard University, Cambridge, MA
Natasha Erdman
Affiliation:
JEOL USA Inc., Peabody, MA
Masateru Shibata
Affiliation:
JEOL USA Inc., Peabody, MA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 560 - 561
Copyright
© Microscopy Society of America 2017 

References

[1] Bell, D.C. & Erdman, N. (ed.) 2013). Low Voltage Electron Microscopy - Principles and Applications. Wiley.Google Scholar
[2] Erdman, N., et al. (2014). Microscopy and Microanalysis 20(S3), 864–865.Google Scholar